Ambient Kelvin Probe System Package
(KPSP, non Scanning)
This entry-level Kelvin Probe system is easy to set-up; it is designed to give drift free measurements and rejects stray capacitance effects that plague other designs. Rapid System Set-up, Tutorials and Tip calibration included. Everything the investigator needs is included!

System Features:

Ambient probe head unit with integral amplifier.

Standard Tip 2 mm diameter (50 Ám diameter option).

Optical Grade Base, System Mounts with 25.5 mm Manual Translator.

Dedicated Dell PC with Software and Data Acquisition System preinstalled.

Vertical Probe Mount as Standard.

Spare Tip, Cables, Manual, Getting Started Tutorials.

Work Function resolution 1-3 meV with Standard Tip.

Sample Holder with Gold Reference Sample.

Faraday Cage.

Export of Data to Excel Compatible Spreadsheets.

Options include Surface Photovoltage Package, Humidity Chamber, Spare tip, gold-coated Tips, (X,Y,Z) manual translator, etc.

Transparent Upgrade option to SKP, SKP5050.

Ambient Advanced Scanning Kelvin Probe System Package (SKP5050)
The SKP5050 system is our best-selling Kelvin Probe system, this is the configuration we use in-house for client samples. It is based upon the ASKP system but includes highly recommended options including color camera/TFT monitor, 2mm and 50Ám tips, external digital oscilloscope, extended warranty.

System Features:

2mm and 50Ám tips.

Work Function resolution 1-3 meV (2mm tip), 5-10 meV (50Ám) tip.

Tip to Sample Height Regulation to within 400 nm.

3D maps of surface potential and sample topography.

Scan Probe or scan sample options.

Color Camera, Zoom Lens, Dedicated TFT Display and optical mounts.

Reference Sample with associated SKP topography.

Spare Tip Amplifier.

24 months warranty.

Ambient Scanning Kelvin Probe System (ASKP)
The KP Technology Scanning Kelvin Probe comes complete with 3 axis micro-translator and controller permitting scanning measurements. The resulting 3D images are stunning!
The feature list is identical to the Kelvin Probe System Package above, with additional features:

Additional Features:

Sample Translation of 50 x 50 mm.

Tip Height Regulation 25 mm.

Translation Step 400 nm.

Software Allows Real-time 3D reporting of WF and Height.

Custom (X,Y) scan programming.


Ambient Kelvin Probes use a non-invasive, non-contact vibrating capacitor technique, which measures to mV resolution the voltage between a vibrating micro-electrode and a conducting or semiconducting sample. The surface potential maps contain information on the sample's work function (which can be used to indicate chemical composition) but more importantly how the surface responds to treatment: such as deposited thin films, oxidation, illumination.
Applications include the fundamental study of corrosion, surface passivation, general of low and high work function surfaces for ion and electron emission, fundamental surface adsorption studies, semiconductor oxide quality, etc.
This system has also been utilised to provide surface charge imaging of non-conductors such as ptfe, platinium-pfte mixtures and charges deposited on top of silicon oxide.
The vibrating tip (amplitude of vibration can be digitally changes from a few microns to 1-2 mm) moves in a plane-parallel fashion with respect to the sample. The mean tip-to-sample spacing is usually in the 0.3 - 1.0 mm range, although measurement can be made with larger tips with an off set of 2-5 mm. The tip actuator is voice-coil driven, powered from a computer controller digital oscillator with a 0.2 - 0.3 Hz frequency resolution. Some of our smaller tips (diameter < 200 um) are shielded using a thin guard electrode. An automatic measurement procedure controls the (x,y,z) micro-translator (0.4 um resolution), amplitude and frequency of oscillation, tip and shield bias. We utilise an 'off-null' measurement procedure featuring a tracking routine to maintain an average tip to sample spacing to within approximately 1 micron, to avoid spurious work function changes associated with spacing changes.
The voltage gradient above most samples is considerable and without the tracking routine measurements, made at different heights will, often not correlate well.
The general-purpose system also includes a peeltier stage to allow sample heating and cooling and an optical illumination source to allow surface photovoltage and surface photovoltage spectroscopy measurements. The Kelvin Probe provides the relative work function between the tip and sample. The work function is highly sensitive to surface conditions: surface processing, roughness, chemical composition, charge and contamination will all produce measurable changes in metal or semiconductor work functions.

Single Electron Transistor Device results scan
Kelvin Probe 50micron tip measuring a Single Electron Transistor Device
Scanning Kelvin Probe
UHV Kelvin Probe
Solar Panels
Scanning Kelvin Probe